Jeol JXA-8200
The JXA-8200 SuperProbe is a high resolution SEM and a WD/ED Combined Electron Probe Microanalyzer (EPMA). Our instrument is equipped with 5 wavelength dispersive X-ray spectrometers (WDS) and an energy dispersive X-ray spectrometer (EDS).
Specs for our instrument are as follows:
Software: JEOL proprietary software or Probe for Windows, Enterprise Edition
Accelerating voltage: 0.2 to 30 kV
- 0.2-30 kV: 0.1 steps
Electron probe current range: 10-12 to 10-5 A
- Electron probe current stability: ± 0.5 X 10-3/hr, ± 0.3 X 10-3/24hr,
Spectrometers (5 WDS and 1 EDS):
WDS:
-Detectable Wavelength Range: 0.087 to 9.3
-Detectable Element Range: 5Be to 92U
-Crystal Types: TAP, PETJ, PETH, LIF, LIFH, LDE1*, LDEB*, LDEC*
* Layered dispersive elements (LDEs) and gas-flow detectors allow light-element analyses
EDS:
- Lithium drift type silicon semi-conductor detector
Secondary-electron (SE) and backscattered-electron (BSE) imaging:
- SE image resolution: 6 nm
- BSE image modes: composition and topography
- Scanning image magnification: 40X to 300,000X (theoretical)
Sample Specifications:
- Maximum sample size: 100 x 100 x 50 mm
- Maximum analyzable area: 90 x 90 mm
- Typical Sample Sizes:
- Up to 6, 1 inch diameter round mounts
- Up to 4, 27 mm X 54 mm thin sections
JEOL JXA-8200 Superprobe
Microscopy
Microprobe Lab Microscopes: Olympus SZX12 (left) and Olympus BX51 (right)
Sample Preparation
Sample Prep Equipment: Accutom-50 (top left), Isomet-1000 (top right), Minimet-1000 (bottom left) and Rotopol-11 (bottom right)